Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Rizzo F., Augieri A., Armenio A.A., Martinelli A., Sotgiu G., Meledin A., Pinto V., Piperno L., Manca N., Cialone M., Iebole M.
Ключевые слова: HTS, YBCO, doping effect, coated conductors, IBAD process, RABITS process, template layers, films, substrate SrTiO3, PLD process, comparison, microstructure, electron diffraction, distribution, X-ray diffraction, lattice parameter, magnetization, temperature dependence, critical current density, distribution, experimental results
Ключевые слова: chalcogenide, FeSeTe, coated conductors, PLD process, IBAD process, RABITS process, substrate Hastelloy, template layers, thin films, substrate single crystal, comparison, X-ray diffraction, lattice parameter, resistive transition, magnetization, temperature dependence, critical caracteristics, Jc/B curves, microstructure, fabrication, experimental results
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., Petrisor JrT.
Ключевые слова: HTS, YBCO, films, template layers, substrate SrTiO3, nanoscaled effects, microstructure, critical caracteristics, critical current density, fabrication, MOD process, surface, pinning centers artificial, X-ray diffraction, Jc/B curves, angular dependence, pinning force, lattice parameter, magnetic field dependence, experimental results
Chen C., Zhao Y., Huhtinen H., Paturi P., Zhu J., Wu Y., Palonen H., Khan M.Z., Rivasto E., Tikkanen J.
Ключевые слова: HTS, YBCO, coated conductors, doping effect, fabrication, IBAD process, buffer layers, cap layers, template layers, critical caracteristics, critical current, anisotropy, lattice parameter, magnetization, temperature dependence, critical current, angular dependence, Jc/B curves, microstructure, defects, experimental results
Ferdeghini C., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Augieri A., Bellingeri E., Sylva G.
Ключевые слова: chalcogenide, FeSeTe, coated conductors, RABITS process, template layers, fabrication, substrate Ni-W, X-ray diffraction, PLD process, microstructure, buffer layers, texture, resistivity, temperature dependence, magnetic field dependence, upper critical fields, irreversibility fields, critical caracteristics, Jc/B curves, pinning force
MOLODYK A., Samoilenkov S., Markelov A., Mankevich A., Adamenkov A., Shulgov D., Kulemanov I., Soldatenko A.
Ключевые слова: HTS, coated conductors, fabrication, IBAD process, template layers, PLD process, buffer layers, films epitaxial, X-ray diffraction, microstructure
Eisterer M., Holzapfel B., Hanisch J., Schultz L., Huhne R., Usoskin A., Tendeloo G.V., Pahlke P., Lao M., Meledin A., Sieger M., Stromer J.
Eisterer M., Holzapfel B., Schultz L., Huhne R., Usoskin A., Pahlke P., Lao M., Hering M., Siegert M., Stromer J.
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, template layers, critical caracteristics, PLD process, microstructure, X-ray diffraction, lattice parameter, thickness dependence, texture, critical temperature, critical current density, substrate stainless steel, fabrication, experimental results
Kaul A.R., Samoilenkov S.V., Markelov A.V., Amelichev V.A., Kamenev A.A., Mankevich A.S., Blednov A.V., Kuchaev A.I., Vavilov A.P., Makarevich A.M., Shchukin A.E., Kalitka V.S., Adamenkov A.A., Chepikov V.N., Matveev A.T., Burova L.I.
Ключевые слова: HTS, coated conductors, substrate Ni-Cr-W, fabrication, buffer layers, MOCVD process, RABITS process, template layers
Ключевые слова: HTS, YBCO, PLD process, coated conductors, fabrication, spray pyrolysis process, template layers, substrate Hastelloy, texture, microstructure
Ключевые слова: HTS, YBCO, coated conductors, fabrication, IBAD process, template layers, RCE-CDR process, economic analysis, RCE-LATS process, review
Matias V., Coulter Y., Sheehan C., Yung C., Glyantsev V., Huh J., Turner P., Dawley J., Maiorov B.M.
Ключевые слова: HTS, coated conductors, fabrication, template layers, planarization, solution techniques, IBAD process, RCE-CDR process, critical caracteristics, n-value, critical current, critical current density, angular dependence, thickness dependence, magnetic field dependence, homogeneity, growth rate, presentation
Ключевые слова: HTS, coated conductors, buffer layers, template layers, fabrication, chemical solution deposition, microstructure
Ключевые слова: presentation, HTS, YBCO, coated conductors, RABITS process, fabrication, seed layers, substrate Ni-W, mechanical properties, ferromagnetic loss, roughness, critical caracteristics, critical current, buffer layers, long conductors, homogeneity, Jc/B curves, microstructure, films epitaxial, texture, template layers, nanoscaled effects
Ключевые слова: funding, plans, collaborations, HTS, coated conductors, template layers, IBAD process, texture, long conductors, planarization, substrate stainless steel, fabrication, presentation
Jia Q.X., DePaula R.F., Stan L., Holesinger T.G., Xiong X., Civale L., Maiorov B., Selvamanickam V., Chen Y.
Ключевые слова: presentation, HTS, coated conductors, economic analysis, IBAD process, co-evaporation process, critical caracteristics, critical current density, thickness dependence, magnetic field dependence, substrate Hastelloy, roughness, electropolishing process, template layers, comparison, plans, YBCO
Ключевые слова: HTS, coated conductors, IBAD process, co-evaporation process, critical caracteristics, template layers, comparison, plans, funding, YBCO, presentation
Ключевые слова: patents, chemical solution deposition, fabrication, template layers, texture, HTS, coated conductors, YBCO
Ключевые слова: HTS, coated conductors, IBAD process, template layers, long conductors, texture, plans, funding, presentation
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, funding, template layers, fabrication, microstructure, texture, substrate Ni-W, plans, collaborations, presentation
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, IBAD process, buffer layers, nanoscaled effects, template layers, long conductors, capacity, fabrication, microstructure, Jc/B curves, doping effect, REBCO, angular dependence, pinning force, texture, current-voltage characteristics, critical current, homogeneity, thickness dependence, presentation, critical caracteristics
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, fabrication, IBAD process, funding, pilot-scale, template layers, pinning, REBCO, high rate process, plans, collaborations, presentation
Ключевые слова: HTS, coated conductors, template layers, IBAD process, substrate stainless steel, texture, YBCO, funding, plans, collaborations, fabrication, presentation
Ключевые слова: presentation, HTS, YBCO, coated conductors, fabrication, TFA-MOD process, fluorine process, electron beam evaporation, Raman spectroscopy, nucleation, microstructure, phase formation, template layers, surface, critical current density, thickness dependence, seed layers, critical caracteristics, measurement technique
Ключевые слова: HTS, YBCO, coated conductors, fabrication, TFA-MOD process, fluorine process, electron beam evaporation, Raman spectroscopy, nucleation, microstructure, phase formation, template layers, surface, critical current density, thickness dependence, seed layers, funding, plans, collaborations, critical caracteristics, measurement technique, presentation
Ключевые слова: HTS, presentation, YBCO, coated conductors, IBAD process, template layers, texture, long conductors, fabrication, length, quality control
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Kato T., Hirayama T., Igarashi M., Hanyu S., Hanada Y., Miura T.
Ключевые слова: HTS, REBCO, coated conductors, IBAD process, PLD process, long conductors, template layers, fabrication, critical current density, critical caracteristics, length
Paranthaman M., Aytug T., Christen D.K., Leonard K.J., Thompson J.R., Kim K., Zhang Y., Ijaduola A.O., Tuncer E.
Ключевые слова: HTS, coated conductors, buffer layers, template layers, IBAD process, microstructure, fabrication, manganites
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, template layers, fabrication, presentation
Ключевые слова: presentation, HTS, YBCO, coated conductors, substrate metallic, RABITS process, mechanical properties, films epitaxial, buffer layers, IBAD process, template layers, MOD process, PVD process, comparison, seed layers, texture, substrate Ni-W, joints, microstructure, critical current, magnetic field dependence, PLD process, critical caracteristics, fabrication
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, template layers, buffer layers, fabrication, microstructure
Ключевые слова: HTS, coated conductors, IBAD process, texture, template layers, reel-to-reel process, YBCO, fabrication
Li Y., Xiong X., Qiao Y., Xie Y., Selvamanickam V., Reeves J.L., Chen Y., Lenseth K.P., Schmidt R.M.
Ключевые слова: HTS, YBCO, coated conductors, long conductors, IBAD process, buffer layers, films epitaxial, fabrication, high rate process, template layers, homogeneity, presentation, length
Ma B., Balachandran U., Xu Y., Efstathiadis H., Bhattacharya R., Lei C.H., Evans H., Manisha R., Massey M.
Li Y., Xiong X., Qiao Y., Xie Y., Reeves J.L., Chen Y., Lenseth K.P., Schmidt R.M., Selvamanickama V.
Ключевые слова: HTS, coated conductors, IBAD process, buffer layers, template layers, long conductors, fabrication, length
Kim C.-J.(cjkim2@kaeri.re.kr), Jun B.-H., Choi J.-K.
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, template layers, buffer layers, RABITS process, IBAD process, comparison, fabrication, critical current, critical caracteristics
Iijima Y., Kakimoto K., Sutoh Y., Saitoh T.(tsaitoh@fujikura.co.jp), Hanyu S., Kaneko N.(nkaneko@fujikura.co.jp)
Ключевые слова: HTS, YBCO, IBAD process, template layers, substrate Ni alloy, nanoscaled roughness, grain alignment, fabrication, coated conductors
Christen D.K., Thompson J.R., Feenstra R., Gapud A.A., Holesinger T.G.(tgholesinger@lanl.gov)
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni, texture, buffer layers, electrolysis, template layers, microstructure
Matias V., Jia Q.X., Wang H., Holesinger T.G., Ayala A.(ayala@lanl.gov), Clem P.G.(pgclem@sandia.gov), Foltyn S., Gibbons B.
Iijima Y., Kakimoto K.(kakimoto@rd.fujikura.co.jp), Saitoh T., Sutoh Y., Kaneko N.
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, template layers, substrate Hastelloy, PLD process, coils solenoidal, reel-to-reel process, long conductors, current-voltage characteristics, critical current density, thickness dependence, tensile tests, bending process, experimental results, fabrication, power equipment, critical caracteristics, quality control
Saitoh T., Kakimoto K., Kato T., Hirayama T., Iijima Y.(ijm@rd.fujikura.co.jp), Sutoh Y., Kaneko N.
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, IBAD process, template layers, texture, fabrication
Holzapfel B., Kursumovic A., Evetts J.E., Puig T., Obradors X., Pomar A., Sandiumenge F., Cavallaro A., Huhne R.(r.huehne@ifw-dresden.de)
Ключевые слова: HTS, substrate Ni-Mn, surface oxidation, template layers, buffer layers, PLD process, MOD process, fabrication
Arendt P.N., Foltyn S.R., Jia Q.X., Wang H., MacManus-Driscoll J.L., Coulter J.Y., Maiorov B., Serquis A., Willis J.O., Maley M.P., Civale L.(lcivale@lanl.gov)
Koritala R.E., Fisher B.L., Baurceanu R., Dorris S.E., Miller D.J., Balachandran U., Berghuis P., Gray K.E., Ma B.(bma@anl.gov), Uprety K.K.
Kreiskott S., Arendt P.N., Foltyn S.R., Matias V., Dowden P.C., Coulter J.Y., Gibbons B.J., Sheehan C.J.
Ключевые слова: HTS, YBCO, coated conductors, reel-to-reel process, IBAD process, template layers, buffer layers, PLD process, fabrication, magnetic properties
Saitoh T., Kakimoto K., Iijima Y.(ijm@rd.fujikura.co.jp), Sutoh Y., Ajimura S.
Thieme C., Goyal A., Specht E.D., Xu Y., Christen D.K., Thompson J.R., Cantoni C., Varela M., Pennycook S.J.
Kreiskott S., Foltyn S.R., Jia Q.X., Wang H., DePaula R.F., Stan L., Groves J.R., Dowden P.C., Holesinger T.G., Coulter J.Y., Civale L., Arendt P.N.(arendt@lanl.gov), Usov I.
Li M., Ma B., Koritala R.E., Fisher B.L., Markowitz A.R., Erck R.A., Baurceanu R., Dorris S.E., Miller D.J., Balachandran U.
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, ISD process, PLD process, template layers, fabrication, magnetic properties
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, IBAD process, template layers, fabrication, magnetic properties
Iijima Y., Kakimoto K.(kakimoto@rd.fujikura.co.jp), Saitoh T.
Rupich M.W., Schoop U., Thieme C., Zhang W., Kodenkandath T., Nguyen N., Arendt P.N., Foltyn S.R., Verebelyi D.T., Li X.(xli@amsuper.com), Jowett M., Holesinger T.G., Aytug T., Christen D.K., Paranthaman M.P.
Fisher B.L., Miller D.J., Balachandran U., Koritala R.E.(koritala@anl.gov), Beihai M., Meiya L.
Ключевые слова: HTS, YBCO, coated conductors, template layers, buffer layers, ISD process, microstructure, fabrication, substrate Ni-V
Arendt P.N., Foltyn S.R., Jia Q.X., DePaula R.F., Stan L., Groves J.R., Dowden P.C., Holesinger T.G., Emmert L.A.
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, template layers, substrate metallic, microstructure, experimental results, fabrication
Ключевые слова: HTS, coated conductors, YBCO, buffer layers, template layers, IBAD process, substrate metallic, fabrication, critical current, critical caracteristics
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